Scanning Probe Microscopy (SPM)

 

 

The scanning probe microscopy laboratory features a Digital Instruments MultiMode AFM/STM.  In addition to scanning tunneling and contact atomic force microscopy (AFM/STM) the instrument features several other operation modes, including non-contact AFM, TappingMode™ AFM, force modulation and magnetic force modes.  Also, the system is equipped with a Hysitron Inc. nanoindentation device capable of sample imaging and measurement of material properties such as hardness and elastic modulus at the nanometer level.